QINGDAO JZLEAP Semiconductor Co.,Ltd.

ICP-MS/MS (Inductively coupled plasma mass spectrometer): Metal ion detection；
Tropel(Flatness measurement equipment):Substrate morphology detection, TTV, Bow, Warp., etc.；
Napson(Resistance meter): Substrate resistance measurement；
CANDELA 8520(Defect detector): substrate defect detection, scratch, particles, pit, micropipe, etc.